Method for producing a group III nitride semiconductor light-emitting device

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United States of America Patent

PATENT NO 8945965
SERIAL NO

13525110

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Abstract

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The present invention provides a Group III nitride semiconductor light-emitting device exhibiting improved light extraction performance. In the production method, a p cladding layer of p-AlGaN is formed by the MOCVD method on a light-emitting layer at a pressure of 30 kPa and with an Mg concentration of 1.5×1020/cm3. A plurality of regions with a nitrogen polarity is formed in the crystals with a Group III element polarity, and thus the p cladding layer has a hexagonal columnar concave and convex configuration on the surface thereof. Subsequently, a p contact layer of GaN is formed by the MOCVD method, in a film along the concave and convex configuration on the p cladding layer.

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TOYODA GOSEI CO LTDAICHI AICHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nakada, Naoyuki Kiyosu, JP 9 56
Ushida, Yasuhisa Kiyosu, JP 16 243

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