INTER-LOW-PERMITTIVITY LAYER INSULATING FILM, AND METHOD FOR FORMING INTER-LOW-PERMITTIVITY LAYER INSULATING FILM

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United States of America Patent

APP PUB NO 20120328798A1
SERIAL NO

13582029

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Abstract

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A low-permittivity interlayer insulating film of the present invention is formed by a plasma CVD method and includes at least carbon and silicon, wherein a ratio of the carbon to the silicon is 2.5 or more, and relative permittivity is 3.8 or less. Also, a film formation method of a low-permittivity interlayer insulating film of the present invention includes forming a film of an insulating film material that includes at least carbon and silicon by a plasma CVD method, wherein a hydrocarbon is not used as the insulating film material, and a ratio of the carbon to the silicon is 2.5 or more, and relative permittivity is 3.8 or less in the formed low-permittivity interlayer insulating film.

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Patent Owner(s)

Patent OwnerAddress
TAIYO NIPPON SANSO CORPORATION3-26 KOYAMA 1-CHOME SHINAGAWA-KU TOKYO 1428558 ?1428558
TRI CHEMICAL LABORATORIES INCYAMANASHI PREFECTURE YAMANASHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kada, Takeshi Hiratsuka-shi, JP 16 76
Nagano, Shuji Moriya-shi, JP 45 1206
Ohashi, Yoshi Takahagi-shi, JP 2 3
Shimizu, Hideharu Tokyo, JP 10 51
Sugawara, Hisakatsu Uenohara-shi, JP 1 0

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