Method and system for charged particle beam lithography
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United States of America Patent
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Mar 18, 2014
Grant Date -
Feb 14, 2013
app pub date -
Aug 10, 2012
filing date -
Aug 12, 2011
priority date (Note) -
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Abstract
There is disclosed a lithography method and system implemented by a charged particle beam passed through a shaping slit member having plural circular apertures of different diameters. The method and system operate to delineate a circular pattern by shooting the shaped circular beam passed through the desired circular aperture onto a workpiece. The method and system consists of causing circular beams shaped using different ones of the circular apertures to be shot onto the workpiece such that the circular beams are coincident with each other in center position to thereby delineate a circular pattern of a desired size. Consequently, circular patterns in a wide range of sizes can be obtained, although a limited number of circular apertures are used.
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