Electrostatic shielding technique on high voltage diodes
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United States of America Patent
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Dec 16, 2014
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app pub date -
Sep 19, 2011
filing date -
Sep 19, 2011
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Abstract
A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.
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