Importance

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Abstract

An interconnection component includes a low coefficient of thermal expansion (“CTE”) element having first and second surfaces defining a thickness, the element consisting essentially of a material having a first CTE of less than 10 parts per million per degree Celsius, the element having a plurality of contacts exposed at a first surface thereof. The component further includes a circuit panel having a dielectric element with first and second surfaces defining a thickness and a plurality of terminals exposed at the first surface, the circuit panel having a thickness greater than 50% of the thickness of the low-CTE element. A bonding layer including a dielectric material bonds the second surfaces of the circuit panel and the low CTE element to one another. Metalized vias are electrically connected with the terminals and the contacts, at least some vias extending through the bonding layer and through the thickness of the low-CTE element.

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First Claim