Test carrier
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United States of America Patent
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Feb 10, 2015
Grant Date -
Apr 4, 2013
app pub date -
Oct 3, 2012
filing date -
Oct 4, 2011
priority date (Note) -
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status (Latency Note)
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Abstract
A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main surface which has bumps which contact electrodes 91 of the die 90; and a cover film 70 which is laid over the base film 40, the die 90 is held between the base film 40 and the cover film 70, the base film 40 has: a first region 40a which has a first thickness t1; and a second region 40b which has a second thickness t2 which is thinner than the first thickness t1, and the second region 40b faces at least a part of the edge 92 of the die 90.
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