WAFER TRAY, SEMICONDUCTOR WAFER TEST APPARATUS, AND TEST METHOD OF SEMICONDUCTOR WAFER

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United States of America Patent

APP PUB NO 20130082727A1
SERIAL NO

13704290

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Abstract

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A wafer tray which holds a semiconductor wafer includes a wafer set plate on which the semiconductor wafer is set, a tray body which supports the wafer set plate to be able to finely move, and a vibration actuator which imparts vibration to the wafer set plate.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATION1-6-2 MARUNOUCHI CHIYODA-KU TOKYO 1000005 ?1000005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsumura, Shigeru Kumagayashi, JP 47 431

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