SYSTEM AND METHOD FOR MEASURING WRINKLE DEPTH IN A COMPOSITE STRUCTURE
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United States of America Patent
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Issued Date -
Apr 11, 2013
app pub date -
May 10, 2011
filing date -
May 10, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
In accordance with one embodiment, a method is provided for non-destructive examination of a composite structure having a non-conductive surface and a conductive substrate. The method may include applying an alternating current to a probe having a coil conductor, scanning the probe across the non-conductive surface to induce eddy currents in the conductive substrate, and measuring changes in an electrical property of the probe in response to changes in the eddy currents indicative of variations in the depth of the conductive substrate.
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