Epitaxial substrate and method for manufacturing epitaxial substrate

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United States of America Patent

PATENT NO 8969880
APP PUB NO 20130092953A1
SERIAL NO

13705554

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Abstract

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Provided is a crack-free epitaxial substrate having a small amount of warping, in which a silicon substrate is used as a base substrate. The epitaxial substrate includes: a (111) single crystal Si substrate and a buffer layer formed of a plurality of lamination units being continuously laminated. The lamination unit includes: a composition modulation layer formed of a first and a second unit layer having different compositions being alternately and repeatedly laminated such that a compressive strain exists therein; a termination layer formed on an uppermost portion of the composition modulation layer, the termination layer acting to maintain the compressive strain existing in the composition modulation layer; and a strain reinforcing layer formed on the termination layer, the strain reinforcing layer acting to enhance the compressive strain existing in the composition modulation layer.

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Patent Owner(s)

Patent OwnerAddress
NGK INSULATORS LTDNAGOYA-SHI AICHI 467-8530

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ichimura, Mikiya Ichinomiya, JP 44 220
Maehara, Sota Nagoya, JP 21 73
Miyoshi, Makoto Inazawa, JP 57 592
Sumiya, Shigeaki Handa, JP 32 248
Tanaka, Mitsuhiro Tsukuba, JP 108 974

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