Three dimensional measurement apparatus, control method therefor, information processing apparatus, control method therefor, and non-transitory computer-readable storage medium
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United States of America Patent
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Aug 15, 2017
Grant Date -
Apr 18, 2013
app pub date -
Oct 9, 2012
filing date -
Oct 17, 2011
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Abstract
A three dimensional measurement apparatus comprising: a projection unit configured to project a pattern including a measurement pattern and a feature pattern onto an object; an image capturing unit configured to capture an image of the object onto which the pattern is projected; a grouping unit configured to divide the captured image into a plurality of regions using the measurement pattern in the pattern and a plurality of epipolar lines determined based on a positional relationship between the projection unit and the image capturing unit, thereby grouping predetermined regions among the plurality of divided regions; a feature recognition unit configured to recognize the feature pattern based on a difference in the feature pattern between the predetermined regions; and a three-dimensional shape calculation unit configured to calculate a three-dimensional shape of the object based on the feature pattern.
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