COHERENCE GRID -- INTERFEROMETER AND METHOD FOR A SPATIALLY RESOLVED OPTIC MEASUREMENT OF THE SURFACE GEOMETRY OF AN OBJECT

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United States of America Patent

APP PUB NO 20130094028A1
SERIAL NO

13647488

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Abstract

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A coherence grid—interferometer for spatially resolved optic measurement of an object, with a light source, an interferometer, a path length—altering unit, and camera with a detection area. The interferometer cooperates with the light source and camera such that an outgoing beam is split into a measuring beam and a reference beam, the measuring beam is at least partially reflected by the object to the detection area of the camera and overlapped via a beam splitter with the reference beam such that the overlapped beams overlap the photo sensors in a planar fashion, and the optic path length—altering unit changes the optic path length of the measuring and/or reference beams. The path length—altering unit has a path scale and a path detector which detect a changing length of the optic path of the measuring and/or reference beams and the interferogram records are synchronized with the path measurement.

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Patent Owner(s)

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POLYTEC GMBHPOLYTEC-PLATZ 1-7 WALDBRONN 76337

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Boedecker, Sebastian Karlsruhe, DE 3 8
Grittmann, Markus Karlsruhe, DE 1 1
Rembe, Christian Waldbronn, DE 19 95

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