OPTICAL SENSING UTILIZING OPTICAL CRYSTAL AND POLARIZATION MEASUREMENTS
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United States of America Patent
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Issued Date -
Apr 25, 2013
app pub date -
Oct 19, 2011
filing date -
Oct 19, 2011
priority date (Note) -
Abandoned
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Abstract
An apparatus for measuring a parameter includes: an optical crystal having an optical axis and configured to be disposed at a selected location; an optical signal source in optical communication with a surface of the crystal and configured to transmit an optical signal having an initial polarization to the surface, the surface configured to reflect at least a portion of the signal as a reflected signal; a detector configured to receive the reflected signal; and a processor configured to determine a polarization of the reflected signal and estimate the parameter at the location based on the polarization of the reflected signal.
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