MULTI-MODAL DATA ANALYSIS FOR DEFECT IDENTIFICATION
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United States of America Patent
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app pub date -
Apr 18, 2012
filing date -
Jan 22, 2008
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Abstract
A technique for identifying a defect in an object produced by a controllable process is disclosed. A first type of data generated as a result of production of the object by the controllable process is obtained. A second type of data generated as a result of production of the object by the controllable process is obtained. The first type of data and the second type of data are jointly analyzed. A defect is identified in the object based on the joint analysis of the first type of data and the second type of data.
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