Synchronous embedded radio frequency pulsing for plasma etching

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United States of America Patent

PATENT NO 8974684
APP PUB NO 20130105443A1
SERIAL NO

13458191

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Abstract

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Methods for etching a substrate are provided herein. In some embodiments, a method of etching a substrate may include generating a plasma by providing only a first RF signal having a first frequency and a first duty cycle; applying only a second RF signal to bias the plasma towards the substrate, wherein the second RF signal has the first frequency and a second duty cycle different than the first duty cycle; adjusting a phase variance between the first and second RF signals to control an ion energy distribution in the plasma; and etching the substrate with the plasma.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Agarwal, Ankur Mountain View, US 85 1963
Banna, Samer San Jose, US 71 3635

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