IMPLEMENTING SCREENING FOR SINGLE FET COMPARE OF PHYSICALLY UNCLONABLE FUNCTION (PUF)
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United States of America Patent
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Apr 9, 2013
Grant Date -
May 2, 2013
app pub date -
Oct 28, 2011
filing date -
Oct 28, 2011
priority date (Note) -
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Abstract
A screening method and circuit for implementing a Physically Unclonable Function (PUF), and a design structure on which the subject circuit resides are provided. A plurality of field effect transistors (FETs) is coupled to a low-offset dynamic comparator and is respectively selected to provide a plurality of FET pairs. For each FET pair, a voltage offset to obtain a comparator output transition is identified and recorded. The recorded voltage offset for each FET pair is compared with a margin threshold value. Each FET pair having an identified voltage offset less than the margin threshold value is discarded or disabled for PUF response generation use.
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