SYSTEM AND METHOD FOR EXAMINING LEAKAGE IMPACTS

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United States of America Patent

APP PUB NO 20130106524A1
SERIAL NO

13287044

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Abstract

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Leakage inversion systems and methods are described. A leakage inverter can be configured to transition a signal, wherein a leakage characteristic impacts a transition of the signal. The leakage inverter can be included in an oscillating ring path that outputs an indication of the impacts the leakage characteristic has on a transition of a signal. A leakage inverter can include a leakage transistor coupled in series between a pull up transistor and a pull down transistor, wherein leakage in the leakage transistor impacts at least one transition of the signal. A pull down transition delay can be asymmetric (e.g., fast/slow, short/long, etc.) with respect to a pull up transition delay. Asymmetry can be associated with an effect of the leakage current on a transition of the signal. Results can be utilized in a variety of different analysis (e.g., analyze manufacturing process compliance and defects, leakage current power consumption, etc.).

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Patent Owner(s)

Patent OwnerAddress
NVIDIA CORPORATION2788 SAN TOMAS EXPRESSWAY SANTA CLARA CA 95051

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Elkin, Ilyas Sunnyvale, US 24 156
Poppe, Wojciech Jakub San Jose, US 5 50

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