Apparatuses, integrated circuits, and methods for measuring leakage current
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United States of America Patent
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Jan 21, 2014
Grant Date -
May 2, 2013
app pub date -
Oct 26, 2011
filing date -
Oct 26, 2011
priority date (Note) -
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Abstract
Methods, apparatuses, and integrated circuits for measuring leakage current are disclosed. In one such example method, a word line is charged to a first voltage, and a measurement node is charged to a second voltage, the second voltage being less than the first voltage. The measurement node is proportionally coupled to the word line. A voltage on the measurement node is compared with a reference voltage. A signal is generated, the signal being indicative of the comparison. Whether a leakage current of the word line is acceptable or not can be determined based on the signal.
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