Apparatus and method for inspecting thermally assisted magnetic head
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United States of America Patent
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Sep 10, 2013
Grant Date -
May 2, 2013
app pub date -
Oct 24, 2012
filing date -
Oct 27, 2011
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Abstract
The wavelength is monitored using a spectrum analyzer in a state where a semiconductor laser is being driven while changing the light-emitting time of the semiconductor laser. When the internal temperature of the semiconductor laser estimated from a measured wavelength falls out of a preset temperature range, a gimbal assembly is identified as a defective product.
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