System and method for backing up test data

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United States of America Patent

PATENT NO 8538925
APP PUB NO 20130110785A1
SERIAL NO

13425435

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Abstract

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In a method for backing up test data using a first backup device and a second backup device, backup times and storage paths for each test computing device in the first backup device and the second backup device, and a backup path of each test computing device are set. Test data of each of the test computing devices are backed up as backup data to the first backup device if a first current time of the first backup device matches the backup time in the first backup device, or to the second backup device if a second current time of the second backup device matches the backup time in the second backup device. Changes of each backup file of the backup data stored under the storage path are recorded. A log file of the backup time is generated.

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Patent Owner(s)

Patent OwnerAddress
HON HAI PRECISION INDUSTRY CO LTD66 CHUNG SHAN ROAD TU-CHENG DIST NEW TAIPEI 236
HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO LTDNO 2 2ND DONGHUAN ROAD LONGHUA TOWN BAO AN DISTRICT SHENZHEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yang, Yong-Sheng Shenzhen, CN 18 36

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