Integrated circuit, test circuit, and method of testing
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United States of America Patent
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Aug 26, 2014
Grant Date -
May 2, 2013
app pub date -
Aug 31, 2012
filing date -
Oct 28, 2011
priority date (Note) -
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Abstract
An integrated circuit includes a storing unit; and a tester that executes a write and read test on the storing unit based on received test information including a pair of address and data, the tester including: a first retain unit that retains, when a write is made based on the test information, the first write address and the first write data used in the write; a first generator that generates, based on the first write address retained in the first retain unit, a first read address used for reading first read data from the first read address in the storing unit simultaneously with writing second write data to a second write address based on the test information; and a second generator that generates, based on the first write data retained in the first retain unit, an expected value of the first read data.
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