DESIGN DATA OPTIMIZATION METHOD, STORAGE MEDIUM INCLUDING PROGRAM FOR DESIGN DATA OPTIMIZATION METHOD AND PHOTOMASK MANUFACTURING METHOD

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United States of America Patent

APP PUB NO 20130111416A1
SERIAL NO

13427025

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Abstract

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According to one embodiment, a design data optimization method includes forming an angular aperture model, in first design data including a first and a second line patterns indicating an interconnect layout, based on an angular aperture between the first line pattern in which a conversion difference prediction point is set in a vertical direction and the second line pattern, and changing a distance between the first and second line patterns or a line width of the first and second line patterns in the first design data based on the angular aperture model and optimizing the first design data to second design data including the first and second line patterns changed.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA72-34 HORIKAWA-CHO SAIWAI-KU KAWASAKI-SHI KANAGAWA 212-0013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kodama, Chikaaki Tokyo, JP 52 401
Kotani, Toshiya Machida-shi, JP 132 1419
NAKAGAWA, Shinichi Yokohama-shi, JP 110 1956
Nakajima, Fumiharu Yokohama-shi, JP 33 139
Nakayama, Kouichi Hiratsuka-shi, JP 16 261

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