CLEANING APPARATUS, SEPARATION SYSTEM AND CLEANING METHOD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20130118530A1
SERIAL NO

13669722

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present disclosure provides a cleaning apparatus that includes a wafer holding unit configured to hold and rotate a target wafer W, and a cleaning jig with a supplying surface that covers a joint surface of the target wafer W. The cleaning jig is provided with a gas-liquid supplying unit configured to supply a solvent of an adhesive, a rinse liquid of the solvent and an inert gas into a gap between the joint surface and the supplying surface. The cleaning jig is also provided with a suction unit configured to suck the solvent or rinse liquid (mixed liquid) which is supplied to the gap between the joint surface and the supplying surface, and a gas supplying unit configured to supply gas to a step portion.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO 107-6325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KOGA, Shinji Kumamoto, JP 29 342
KOMEDA, Hiroshi Kumamoto, JP 4 7
MANABE, Eiji Kumamoto, JP 6 12
SAKAI, Takahide Kumamoto, JP 1 2

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