Leakage tolerant delay locked loop circuit device

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United States of America Patent

PATENT NO 8493117
APP PUB NO 20130120041A1
SERIAL NO

13295351

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Abstract

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Leakage tolerant delay locked loop (DLL) circuit devices and methods of locking phases of output phase signals to a phase of a reference signal using a leakage tolerant DLL circuit device are provided. Embodiments include a DLL circuit device comprising: a primary loop and a secondary correction circuit. The primary loop includes a phase detector, an error controller, and a voltage controlled buffer (VCB). The secondary correction circuit is configured to generate and provide secondary error-delay signals to the error controller. The secondary correction circuit includes multiple error generators. Each error generator is configured to generate a secondary error-delay signal in response to detecting a particular edge of an output phase signal from the VCB. The primary loop is configured to control a phase adjustment based on at least one of a first error-delay-increase signal, a first error-delay-decrease signal, and the secondary error-delay signals.

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Patent Owner(s)

Patent OwnerAddress
MARVELL ASIA PTE LTDSINGAPORE SINGAPORE CITY SINGAPORE CITY SINGAPORE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sorna, Michael A Hopewell Junction, US 56 894
Thiagarajan, Pradeep Chapel Hill, US 44 282

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