Method of forming photomasks and photomasks formed by the same

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United States of America Patent

PATENT NO 8697318
APP PUB NO 20130122404A1
SERIAL NO

13602598

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Abstract

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A method of manufacturing a photomask includes forming a multi-layer on a substrate and a blank layer on the multi-layer, patterning the blank layer to form openings exposing the multi-layer on a projection region of the substrate, and irradiating at least a portion of the multi-layer exposed by the openings with pulses of light output by a pulse laser whose pulse width is substantially greater than 0.001 seconds. Thus, the photomask has a reflective layer that includes a low-reflectance part corresponding to that part of the multi-layer irradiated by the light output by the pulse laser.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTD129 SAMSUNG-RO YEONGTONG-GU SUWON-SI GYEONGGI-DO 16677

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Sang Hyun Daejeon, KR 161 1009
Lee, Donggun Hwaseong-si, KR 31 85
Park, Jongju Hwaseong-si, KR 15 40

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