SEMICONDUCTOR TEST APPARATUS

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United States of America Patent

APP PUB NO 20130125658A1
SERIAL NO

13489719

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A semiconductor test apparatus is provided. The semiconductor test apparatus includes a plate on which a custom tray is mounted, a carrier connected to the plate to transfer the plate, and a vibrator vibrating the plate while the plate is transferred.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDSUWON-SI GYEONGGI-DO 16677

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Sang-Jun Cheonan-si, KR 60 487
Lee, Young-Gil Asan-si, KR 14 142

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