Device and method for acquiring a microscopic image of a sample structure

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United States of America Patent

PATENT NO 9720221
APP PUB NO 20130128025A1
SERIAL NO

13812443

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Abstract

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A device and a method for acquiring a microscopic image of a sample structure are described. An optic for imaging the sample structure and a reference structure is provided, as well as a drift sensing unit for sensing a drift of the sample structure relative to the optic on the basis of the imaged reference structure. The optic comprises a first sharpness plane for imaging the sample structure and at the same time a second sharpness plane, modifiable in location relative to the first sharpness plane, for imaging the reference structure.

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Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMS CMS GMBHERNST-LEITZ-STRASSE 17-37 WETZLAR 35578

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dyba, Marcus Heidelberg, DE 20 198
Foelling, Jonas Heidelberg, DE 12 53

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