Formation of devices by epitaxial layer overgrowth

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United States of America Patent

PATENT NO 9934967
SERIAL NO

13737731

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Abstract

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Methods and structures are provided for formation of devices, e.g., solar cells, on substrates including, e.g., lattice-mismatched materials, by the use of aspect ratio trapping and epitaxial layer overgrowth. A method includes forming an opening in a masking layer disposed over a substrate that includes a first semiconductor material. A first layer, which includes a second semiconductor material lattice-mismatched to the first semiconductor material, is formed within the opening. The first layer has a thickness sufficient to extend above a top surface of the masking layer. A second layer, which includes the second semiconductor material, is formed on the first layer and over at least a portion of the masking layer. A vertical growth rate of the first layer is greater than a lateral growth rate of the first layer and a lateral growth rate of the second layer is greater than a vertical growth rate of the second layer.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bai, Jie Bedford, US 129 835
Cheng, Zhinyuan Lincoln, US 1 9
Fiorenza, James Wilmington, US 32 1944
Hydrick, Jennifer M Kingston, US 5 159
Li, Jizhong Bordentown, US 21 1005
Lochtefeld, Anthony J Ipswich, US 114 5655
Park, Ji-Soo Methuen, US 32 951

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