Semiconductor structure having a polysilicon structure and method of forming same

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United States of America Patent

PATENT NO 8574989
APP PUB NO 20130146993A1
SERIAL NO

13314462

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Abstract

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The present application discloses a method of forming a semiconductor structure. In at least one embodiment, the method includes forming a polysilicon layer over a substrate. A mask layer is formed over the polysilicon layer. The mask layer is patterned to form a patterned mask layer. A polysilicon structure is formed by etching the polysilicon layer using the patterned mask layer as a mask. The polysilicon structure has an upper surface and a lower surface, and the etching of the polysilicon layer is arranged to cause a width of the upper surface of the polysilicon structure greater than that of the lower surface of the polysilicon structure.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Che-Cheng New Taipei, TW 409 2774
Chen, Ryan Chia-Jen Chiayi, TW 173 1719
Fang, Buh-Kuan Zhubei, TW 8 58
Lin, Jr-Jung Wurih Township, TW 69 682
Wu, Po-Chi Zhubei, TW 70 435

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