OPTICAL INSPECTING SYSTEM
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United States of America Patent
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N/A
Issued Date -
Jul 4, 2013
app pub date -
Oct 29, 2012
filing date -
Dec 29, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
An optical inspecting system for inspecting a surface of a solar cell chip includes a housing, a control device, an image capturing device and a lighting device configured in the housing. The lighting device provides monochromatic lights on the solar cell chip, and the image capturing device captures the image of the solar cell chip. The control device is electrically connected to the image capturing device and the lighting device for controlling the optical inspecting system to perform defect and color inspecting processes on the surface of the solar cell chip. By the communication among the image capturing device, the lighting device, and the control device, images with different resolutions can be obtained according to different inspecting processes, and monochrome sensor array can be used for decreasing error.
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