METHODS FOR FINDING AND CHARACTERIZING A DEFORMED PATTERN IN AN IMAGE

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United States of America Patent

SERIAL NO

13689962

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Abstract

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A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern. Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn't contain information about the pattern's distorted location.

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Patent Owner(s)

Patent OwnerAddress
COGNEX TECHNOLOGY AND INVESTMENT CORPORATIONMOUNTAIN VIEW CA 94043

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Davis, Jason Franklin, US 68 519

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