TESTING APPARATUS FOR PERFORMING AVALANCHE TEST
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United States of America Patent
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Issued Date -
Sep 5, 2013
app pub date -
Mar 5, 2012
filing date -
Mar 5, 2012
priority date (Note) -
Abandoned
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Abstract
A testing apparatus for performing an avalanche test includes a wafer chuck configured to retain a wafer having a plurality of transistors, wherein the wafer chuck includes an insulating body and a plurality of conductors embedded in the insulating body. In one embodiment of the present invention, the device holder includes a plurality of conductors having horizontal sides and longitudinal sides, a plurality of insulating horizontal lines positioned at the horizontal sides, and a plurality of insulating longitudinal lines positioned at the longitudinal sides and intersecting the horizontal lines.
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