TESTING APPARATUS FOR PERFORMING AN AVALANCHE TEST AND METHOD THEREOF
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United States of America Patent
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Issued Date -
Sep 5, 2013
app pub date -
Mar 5, 2012
filing date -
Mar 5, 2012
priority date (Note) -
Abandoned
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Abstract
A testing apparatus for performing an avalanche test comprises a wafer chuck configured to retain a wafer having a plurality of transistors, an inductor with a first end connected to a drain terminal of the transistor, a power source configured to provide a current to a second end of the inductor through a switch, a meter connected to a source terminal of the transistor through the wafer chuck, and a driver configured to synchronously control the operation of the switch and the operation of the transistor.
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