Kelvin Sense Probe Calibration
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United States of America Patent
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Issued Date -
Sep 26, 2013
app pub date -
Mar 23, 2012
filing date -
Mar 23, 2012
priority date (Note) -
Abandoned
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Abstract
Calibrating automatic test systems for testing electronic components using Kelvin probes is taught. A nominal contact resistance of a Kelvin probe is measured using a test slug to replace an electronic component to be measured on the test system. The measured resistance is stored by the test system and can be used to compensate for a measured value for an electronic component. A test slug can be periodically inserted into the test system to update the contact resistance measure and/or track the contact resistance to measure Kelvin probe wear and/or contamination.
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