Inspection Apparatus, Inspection Method and Program for Inspection

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United States of America Patent

APP PUB NO 20130258329A1
SERIAL NO

13845858

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Abstract

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In a first platen gap, a light emitting amount is decided to obtain a light receiving amount for inspection as a first light emitting amount for inspection. Subsequently, in a second platen gap, a light emitting amount is decided to obtain a light receiving amount for inspection as a second light emitting amount for inspection. An inspection on dot forming is performed, using a smaller light emitting amount for inspection between the first and second light emitting amounts for inspection, and using the platen gap in which the smaller light emitting amount for inspection is decided.

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATIONTOKYO 160-8801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HIGUCHI, Yu Shiojiri-shi, JP 9 26
IZUO, Seiji Shiojiri-shi, JP 23 92

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