SCAN-BASED CAPTURE AND SHIFT OF INTERFACE FUNCTIONAL SIGNAL VALUES IN CONJUNCTION WITH BUILT-IN SELF-TEST
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United States of America Patent
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Issued Date -
Oct 17, 2013
app pub date -
Apr 12, 2012
filing date -
Apr 12, 2012
priority date (Note) -
Abandoned
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Abstract
An integrated circuit comprises a memory or other type of circuit core having an input interface and an output interface, built-in self-test circuitry configured for testing of the circuit core between its input and output interfaces in a built-in self-test mode of operation, and at least one scan chain having a plurality of scan cells. The scan cells of the scan chain are coupled to respective signal lines at the input and output interfaces and configured to allow capture of functional signal values from those signal lines in a functional mode of operation and shifting out of the captured functional signal values in a scan shift mode of operation. This allows detection of faults associated with functional paths of the interface that would otherwise not be detectable using the built-in self-test circuitry.
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