Method and Apparatus for Examining Eggs
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United States of America Patent
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N/A
Issued Date -
Oct 31, 2013
app pub date -
Nov 3, 2011
filing date -
Nov 5, 2010
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
This invention relates to a method and apparatus for examining eggs, in particular for determining eggshell characteristics of eggs, the method comprising,—positioning the eggs to be examined,—with a deformer, deforming a part of such an egg at least once,—at least determining deformation contact time, and—determining the shell stiffness and/or the eggshell strength of such an egg. Such a manner of detection can be suitably applied to sorting machines for eggs. With this methodology, in a short time, for a very large number of products, such as eggs in the present case, a quality parameter such as the strength and/or stiffness can be determined. With such determinations, in an advantageous manner, high requirements set in many fields of technology and industry can be met.
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