Inspection method of backlight module and inspection apparatus thereof
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United States of America Patent
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Issued Date -
Oct 31, 2013
app pub date -
May 4, 2012
filing date -
Apr 27, 2012
priority date (Note) -
Abandoned
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Abstract
The present invention provides an inspection method of a backlight module and an inspection apparatus. The inspection method of the backlight module comprising: obtaining space brightness values of multiple positions of the backlight module on an inspection machine when the backlight module is setting in standard luminance mode, and setting the space brightness values as standard brightness values; obtaining real-time space brightness values of the multiple positions of the backlight module; comparing the real-time space brightness values with the standard space brightness values in order to determine if the backlight module is abnormal. The present invention compares the real-time space brightness values measured by the brightness meters with the standard space brightness values corresponding to the standard luminance mode of the backlight module in order to determine if the backlight module is abnormal instantaneously, and using the brightness meters to replace the luminance meters results in cost saving.
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