In-process material characterization
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United States of America Patent
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Oct 11, 2016
Grant Date -
Nov 21, 2013
app pub date -
May 14, 2013
filing date -
May 16, 2012
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Abstract
Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.
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