METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS

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United States of America Patent

APP PUB NO 20130315377A1
SERIAL NO

13855282

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

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Patent Owner(s)

Patent OwnerAddress
PASSPORT SYSTEMS INCBILLERICA MA 01862

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bertozzi, William Lexington, US 35 507
Ledoux, Robert J Harvard, US 35 335

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