METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS
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United States of America Patent
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Issued Date -
Nov 28, 2013
app pub date -
Apr 2, 2013
filing date -
Jul 8, 2004
priority date (Note) -
Abandoned
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Abstract
Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
PASSPORT SYSTEMS INC | BILLERICA MA 01862 |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Bertozzi, William | Lexington, US | 35 | 507 |
Ledoux, Robert J | Harvard, US | 35 | 336 |
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