METHOD FOR MEASURING THE LIGHT PROPERTIES OF LIGHT-EMITTING DIODES
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United States of America Patent
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Issued Date -
Dec 19, 2013
app pub date -
May 23, 2013
filing date -
Jun 13, 2012
priority date (Note) -
Abandoned
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Abstract
The invention relates to a method for measuring the light properties of light-emitting diodes (LEDs) in an arrangement of a plurality of channels connected in parallel, each having at least one LED per channel and a driver for driving the channels by means of pulse width modulation (PWM), in such a way that at least one pulse of predetermined width can be generated for each channel within a PWM period, wherein the LED of a selected channel is measured during a measurement interval, the measurement interval overlapping a pulse, lying within the PWM period, of a selected channel.
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