CONDITIONER FOR SOFT PAD AND METHOD FOR MANUFACTURING SAME

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United States of America Patent

APP PUB NO 20130344779A1
SERIAL NO

14003493

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Abstract

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The present invention relates to a conditioner for a chemical-mechanical planarization (CMP) pad, which is used in a CMP process that is part of a semiconductor element manufacturing process, and more particularly, to a conditioner for a soft pad, and a method of manufacturing the same, wherein the conditioner can be used under CMP conditions using a slurry having a small amount of polishing particles, and/or a porous pad having comparatively low hardness and very high porosity.

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Patent Owner(s)

Patent OwnerAddress
EHWA DIAMOND INDUSTRIAL CO LTDKYUNGGIDO 447804

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Youn Chul Gyeonggi-do, KR 8 36
Lee, Jong Jae Gyeonggi-do, KR 39 101
Lee, Joo Han Gyeonggi-do, KR 17 112
Lee, Seh Kwang Gyeonggi-do, KR 9 21

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