Methods and apparatuses for calibrating data sampling points
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United States of America Patent
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Dec 15, 2015
Grant Date -
Jan 30, 2014
app pub date -
Jul 26, 2012
filing date -
Jul 26, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
Methods and apparatuses for calibrating data sampling points are disclosed herein. An example apparatus may include a memory that may be configured to receive a calibration command and an attribute. The memory may include a first register that is configured to store a tuning data pattern and a second register that is configured to receive and store the tuning data pattern stored in the first register. The second register may be further configured to store the tuning data pattern responsive, at least in part, to the memory receiving the calibration command. The memory may be configured to execute an operation on at least one of the tuning data pattern stored in the first register or the tuning data pattern stored in the second register based, at least in part, on the attribute.
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