Highly accurate calibration of microwave radiometry devices
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United States of America Patent
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Issued Date -
Feb 6, 2014
app pub date -
Jul 31, 2012
filing date -
Jul 31, 2012
priority date (Note) -
Abandoned
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Abstract
Systems and methods are disclosed for highly accurate calibration of microwave radiometry devices by defeating reflections from a cryogenic blackbody calibration target and, further, defeating a standing wave established between reflecting features at the device and at the blackbody calibration target. The preferred disclosed system includes adaptations for effective Brewster angle presentation of radiation emanating from the target to the radiometry device. Other embodiments are taught for substantially eliminating or randomizing the standing wave in both wavelength dependent and independent applications.
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