Examination of a silicon substrate for a solar cell

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9165844
APP PUB NO 20140038316A1
SERIAL NO

13941910

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The invention relates to a method for examining a wire-sawn silicon substrate for a solar cell. The method includes irradiating the silicon substrate with an infrared radiation, detecting the infrared radiation transmitted through the silicon substrate, and analyzing the detected infrared radiation for characterizing the crystal orientation of the silicon substrate. The invention in addition relates to a device for carrying out such a method, and a method for manufacturing a solar cell.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
SOLARWORLD INDUSTRIES GMBHMARTIN-LUTHER-KING-STR 24 BONN 53175

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fulle, Alexander Wilkau-Hasslau, DE 1 3
Krause, Andreas Radebeul, DE 123 685
Sylla, Lamine Dresden, DE 2 3

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
11.5 Year Payment $7400.00 $3700.00 $1850.00 Apr 20, 2027
Fee Large entity fee small entity fee micro entity fee
Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00