VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY
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United States of America Patent
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Issued Date -
Feb 13, 2014
app pub date -
Aug 9, 2013
filing date -
Aug 9, 2012
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A testing method (and the probes used) comprising providing one or more probes each comprising: a body portion which is substantially straight; an extended portion extending from the body portion and comprising at least two separate probe portions; and a tip portion at the opposite end of the extended portion; and contacting an object to be tested with the one or more probes.
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