System and Method for Machine Vision Inspection
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United States of America Patent
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Issued Date -
Feb 20, 2014
app pub date -
Aug 17, 2012
filing date -
Aug 17, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A computer-implemented method for use in machine vision systems is provided. The method can include receiving a source image and segmenting the source image into one or more segments. The method can further include receiving a selection of a first segment of the one or more segments associated with the source image and generating a first mask image, based upon, at least in part, the first segment. The method can also include determining at least one attribute associated with the first segment and normalizing a masked area of a runtime image using, at least in part, the at least one attribute.
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