MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHOD INCLUDING MEASURING METHOD
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United States of America Patent
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Issued Date -
Mar 13, 2014
app pub date -
Jul 26, 2013
filing date -
Sep 7, 2012
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A measuring device includes: a probe applying a voltage to an electrode of an element; and a supplying member supplying an insulating liquid to a contact portion between the electrode and the probe via a surface of the probe. Accordingly, the insulating liquid can be securely supplied to the contact portion between the electrode and the probe via the surface of the probe positioned relative to the electrode.
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