METHOD AND APPARATUS FOR MEASURING THE REFLECTION PROPERTIES OF A REFLECTOR
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United States of America Patent
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app pub date -
Jan 30, 2012
filing date -
Jan 28, 2011
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Abandoned
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Abstract
The invention comprises a method and a device for measuring a reflector for radiation during the operation thereof, in which to determine the current reflection properties of the reflector in a number of at least one measurement points provided in the path of the radiation reflected by the reflector, the pattern of predetermined characteristics of the currently reflected radiation is measured and compared with a predetermined reference pattern, wherein the current geometrical properties of the reflector are inferred from the comparison and in the event of undesired geometrical properties, appropriate operational parameters of the reflector are modified. This method is preferably applied in trough collectors for solar power plants, in order to measure flexible concentrators arranged in a pressure cell, during their operation.
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