METHOD FOR PLASMA ETCHING AND PLASMA ETCHING APPARATUS THEREOF

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United States of America Patent

APP PUB NO 20140073138A1
SERIAL NO

13611464

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Abstract

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A method for plasma etching is provided, wherein a substrate pre-defining a plurality of to-be-etched segments is secured on a movable stage, and a spray area of plasma from a plasma gun is limited to get a spray-area-limited plasma. Then, at least one of the to-be-etched segments is positioned in an etch position in turn by a step and repeat manner, to make the to-be-etched segments in the etch position to be etched by the spray-area-limited plasma. A plasma etching apparatus is also provided, so that the uniformity of the plasma etching process may be controlled precisely to raise the etching uniformity.

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Patent Owner(s)

Patent OwnerAddress
HERMES-EPITEK CORP14F NO 38 SEC 2 DUNHUA S RD DA-AN DIST TAIPEI CITY 106

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Ming-Yu Qionglin Township, TW 22 39
Hwang, Min-Chi Hsinchu City, TW 1 0

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